WhatQuantitative diagnosis of material and structural reliability
We measure material properties, degradation over time, layered structures, and internal defects such as delamination, voids, foreign objects, and moisture ingress, without contact or damage. Micro-defects that remain in products that passed quality inspection are managed as quantitative data.
HowLayer thickness from the time difference of reflected signals
Terahertz waves lie between radio waves and light. They pass through non-conductive materials and reflect at layer boundaries. From the arrival-time differences of the reflected signals, we calculate layer thickness and defect position at the micrometer scale. Unlike X-rays, they involve no ionizing radiation, and they resolve thinner layers than ultrasound.
WhereMaterials and parts with multilayer structures
We inspect layered products such as automotive multilayer paint, secondary battery separators, hydrogen fuel cell membranes, thermal barrier coatings and heat-shield structures, food packaging, and semiconductor packages. Results are delivered as a report listing each item, measured value, reference range, and judgment.